Atom Probe Tomography : Put Theory Into Practice
Atom Probe Tomography : Put Theory Into Practice
复制标题
原子探针断层扫描：将理论付诸实践
DOI：
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发表时间：
2016
期刊：
影响因子：
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通讯作者：
W. Lefebvre
中科院分区：
文献类型：
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作者：
W. Lefebvre
原子探针断层扫描是针对初学者和研究人员有兴趣扩大他们在这一领域的专业知识。它提供了必要的理论背景和实际信息，以调查如何使用原子探针显微镜技术的材料工作，并包括基本原理，仪器，当代标本制备技术和实验细节的详细解释，以及可以获得的结果的概述。这本书强调了评估数据质量的过程和高级数据挖掘算法的正确实施。对于那些更有经验的技术，这本书将作为一个单一的综合来源不可或缺的参考信息，表格和技术。初学者和专家都会重视这本书在材料科学和工程背景下的阐述方式。此外，它参考的关键研究成果的基础上举行的培训计划在鲁昂大学-一个领先的科学研究中心探索的各个方面的仪器-将进一步加强理解和学习过程。提供了一个介绍的能力和限制原子探针断层扫描时，分析材料写为有经验的研究人员和新用户包括练习，沿着与纠正，供用户练习所讨论的技术包含更先进和不太广泛的技术，如相关的APT和STEM显微镜
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process.Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materialsWritten for both experienced researchers and new usersIncludes exercises, along with corrections, for users to practice the techniques discussedContains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy