Detection of X-ray polarization with a charge coupled device
Detection of X-ray polarization with a charge coupled device
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使用电荷耦合装置检测 X 射线偏振
DOI：
10.1016/0168-9002(92)90075-f
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发表时间：
1992
影响因子：
1.4
通讯作者：
E. Miyata
中科院分区：
文献类型：
--
作者：
H. Tsunemi;K. Hayashida;K. Tamura;S. Nomoto;M. Wada;A. Hirano;E. Miyata
这里我们报告检测结果的极化x射线电荷耦合装置(OCD)的像素大小12×12μ平方米。硅中产生的初级电荷云沿平行于入射x射线的电矢量的光电子的初始动量方向延伸。利用同步辐射装置研究了扩散事件的结构，发现CCD可以探测到15-37 keV入射x射线的偏振。
We report here the results of the detection of polarized X-rays with a charge coupled device (OCD) whose pixel size is 12×12 μm2. The primary charge clouds produced in the silicon extends in the direction of the initial momentum of the photoelectron that is parallel to the electric vectoreof the incident X-ray. Using a synchrotron radiation facility, we studied the structure of spread events and found that the CCD could detect the polarization of incident X-rays for 15–37 keV.