X‐ray topography with highly collimated beam at photon factory
X‐ray topography with highly collimated beam at photon factory
复制标题
光子工厂的高度准直光束 X 射线形貌
DOI：
10.1063/1.1140707
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发表时间：
1989
影响因子：
1.6
通讯作者：
T. Ishikawa
中科院分区：
文献类型：
--
作者：
T. Ishikawa
本文描述了光子工厂多晶体排列的高精度衍射仪的最新进展。给出了用该衍射仪进行地形测量的新的X射线光学方法，包括平面波地形、超平面波地形和等间距测绘地形。
Recent developments of a high‐precision diffractometer for multiple crystal arrangement at the Photon Factory is described. New x‐ray optics for topography using this diffractometer are shown, including plane‐wave topography, ultraplane wave topography and equilattice‐spacing mapping topography.