Method for Fabricating Depth-Specific TEM In Situ Tensile Bars
Method for Fabricating Depth-Specific TEM In Situ Tensile Bars
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DOI:
10.1007/s11837-020-04105-8
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发表时间:
2020-03
期刊:
影响因子:
2.6
通讯作者:
Patrick H. Warren;George Warren;Megha Dubey;Jatuporn Burns;Yaqiao Wu;J. Wharry
中科院分区:
文献类型:
--
作者:
Patrick H. Warren;George Warren;Megha Dubey;Jatuporn Burns;Yaqiao Wu;J. Wharry
The growing use of ion irradiation to assess degradation of nuclear materials has created a need to develop novel methods to probe the mechanical response of shallow ion-irradiated layers. Transmission electron microscopy (TEM) in situ mechanical testing can isolate the ion-irradiated layer from its unirradiated substrate. However, there is a lack of established procedures for preparing TEM in situ mechanical testing specimens from bulk materials requiring depth-specific examination, e.g., target dose on the ion irradiation damage profile. This study demonstrates a new method for extracting depth-specific TEM in situ tensile bars from a bulk specimen of Fe-5 wt.%Mo. Measured yield stress, ultimate tensile stress, Young’s modulus, and elongation are consistent with those properties obtained from similarly sized Fe and Mo single-crystal nanowires. Results are discussed in the context of the specimen size effect.