Scanner parameter estimation using bilevel scans of star charts
Scanner parameter estimation using bilevel scans of star charts
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使用星图双层扫描进行扫描仪参数估计
DOI：
10.1109/icdar.2001.953968
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发表时间：
2001
期刊：
影响因子：
--
通讯作者：
E. B. Smith
中科院分区：
文献类型：
--
作者：
E. B. Smith
在二值模式下扫描高对比度图像会导致图像质量下降。这是由两个主要效应引起的：模糊和阈值化。本文提出了一种从一张星星扇形测试图中估计一个称为边缘扩展的联合失真参数的方法，以计算点扩展函数宽度和二值化阈值。这个理论也被描述为源图案的变化，其可以表示由重复的双电平过程引起的退化，如将在打印然后扫描中看到的，或者在重复的复印中看到的。估计结果显示的基本和扩展的情况下。
Scanning a high-contrast image in bilevel mode results in image degradation. This is caused by two primary effects: blurring and thresholding. This paper expands on a method of estimating a joint distortion parameter called the edge spread, from a star sector test chart in order to calculate the values of the point spread function width and binarization threshold. This theory is also described for variations in the source pattern which can represent degradations caused by repetition of the bilevel process as would be seen in printing then scanning, or in repeated photocopying. Estimation results are shown for the basic and extended cases.