In-situ X-ray-diffraction studies of hydrogenated nanocrystalline gadolinium films
In-situ X-ray-diffraction studies of hydrogenated nanocrystalline gadolinium films
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DOI：
10.1007/s10853-006-0798-9
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发表时间：
2006-09
影响因子：
4.5
通讯作者：
E. Shalaan;K. Ehses;H. Schmitt
中科院分区：
文献类型：
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作者：
E. Shalaan;K. Ehses;H. Schmitt
超细晶粒和纳米晶微结构作为实现增强的强度和有趣的性能组合的手段，引起了人们极大的兴趣。当暴露于气态氢时，薄的Pd覆盖的稀土金属膜可逆地从它们的初始反射状态（金属相）切换到视觉上透明的状态（绝缘体或半导体相）。通过暴露在空气中可以恢复到反射状态。采用射频溅射技术制备了不同晶粒尺寸的钯包覆纳米钆薄膜。这些金属膜暴露于氢导致形成的氧化物和增加的无序。的nc-Gd膜的微观结构，其特征在于通过原位X射线衍射研究在氢负载。晶粒尺寸，微观应变，和晶格参数进行了测定。
There is a great deal of interest in ultra-fine grained and nanocrystalline microstructure as a means of achieving enhanced strengths and interesting combinations of properties. Thin Pd-capped rare-earth metallic films switch reversibly from their initial reflecting state (metal phase) to visually transparent state (insulator or semiconductor phase) when exposed to gaseous hydrogen. Reversion to the reflecting state is achieved by exposure to air. Palladium-capped nanocrystalline gadolinium films with different grain sizes were prepared by rf-sputtering technique. Exposure of these metallic films to hydrogen resulted in formation of hydrides and increased disorder. The microstructure of the nc-Gd films were characterized by in-situ X-ray-diffraction studies during hydrogen loading. The grain size, the microstrain, and the lattice parameters were determined.