Automatic Detection of Region-Mura Defect in TFT-LCD
Automatic Detection of Region-Mura Defect in TFT-LCD
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发表时间：
2004-10
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通讯作者：
J. Y. Lee;S. Yoo
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作者：
J. Y. Lee;S. Yoo
视觉缺陷，在领域中称为村病，有时会发生在制造平板液晶显示器。本文提出了一种可靠地检测和量化TFT-LCD区域缺陷的自动检测方法。该方法包括两个阶段。在第一阶段，我们使用改进的回归诊断和Niblack阈值从TFT-LCD面板图像中分割候选区域。在第二阶段，基于人眼对mura的敏感性，我们量化每个候选人的mura水平，通过对他们进行合格或不合格的评分来识别真正的mura。在实际TFT-LCD面板样品上对该方法的性能进行了评价。关键词：机器视觉，图像分割，回归诊断，工业检测，视觉感知。
Visual defects, called mura in the field, sometimes occur during the manufacturing of the flat panel liquid crystal displays. In this paper we propose an automatic inspection method that reliably detects and quantifies TFT-LCD regionmura defects. The method consists of two phases. In the first phase we segment candidate region-muras from TFT-LCD panel images using the modified regression diagnostics and Niblack’s thresholding. In the second phase, based on the human eye’s sensitivity to mura, we quantify mura level for each candidate, which is used to identify real muras by grading them as pass or fail. Performance of the proposed method is evaluated on real TFT-LCD panel samples. key words: Machine vision, image segmentation, regression diagnostics, industrial inspection, visual perception.