Estimation of presampling modulation transfer function in synchrotron radiation microtomography
Estimation of presampling modulation transfer function in synchrotron radiation microtomography
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DOI：
10.1016/j.nima.2010.03.111
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发表时间：
2010-09-01
影响因子：
1.4
通讯作者：
Suzuki, Yoshio
中科院分区：
文献类型：
--
作者：
Mizutani, Ryuta;Taguchi, Keisuke;Suzuki, Yoshio
最近的同步辐射显微断层摄影机所达到的空间分辨率，应估计从调制传递函数（MTF）在微米尺度上。采用高精度金刚石晶体表面和离子铣削铝丝表面，用斜刃法测量了同步辐射显微层析成像仪的阶跃响应函数。倾斜重建通过定义任意方向的重建像素矩阵，使得任意边缘都可以作为倾斜边缘。从倾斜边缘的阶跃响应函数估计MTF。所得到的MTF与从铝表面上铣削的方波图案估计的MTF值相吻合。虽然X射线折射的影响应考虑到评估MTF，任何平面与纳米粗糙度可以用来确定显微断层摄影的空间分辨率。(C)2010 Elsevier BV保留所有权利。
The spatial resolution achieved by recent synchrotron radiation microtomographs should be estimated from the modulation transfer function (MTF) on the micrometer scale. Step response functions of a synchrotron radiation microtomograph were determined by the slanted edge method by using high-precision surfaces of diamond crystal and ion-milled aluminum wire. Tilted reconstruction was introduced to enable any edge to be used as the slanted edge by defining the reconstruction pixel matrix in an arbitrary orientation. MTFs were estimated from the step response functions of the slanted edges. The obtained MTFs coincided with MTF values estimated from square-wave patterns milled on the aluminum surface. Although X-ray refraction influences should be taken into account to evaluate MTFs, any flat surfaces with nanometer roughness can be used to determine the spatial resolutions of microtomographs. (C) 2010 Elsevier B.V. All rights reserved.