Adaptive Mitigation of Radiation-Induced Errors and TDDB in Reconfigurable Logic Fabrics
Adaptive Mitigation of Radiation-Induced Errors and TDDB in Reconfigurable Logic Fabrics
复制标题
可重构逻辑结构中辐射引起的错误和 TDDB 的自适应缓解
DOI：
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发表时间：
2015
期刊：
影响因子：
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通讯作者：
R. Demara
中科院分区：
文献类型：
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作者：
R. Al;R. Oreifej;Ramtin Zand;A. Ejnioui;R. Demara
随着基于sram的可重构器件的技术扩展和逻辑容量的增加，关键任务系统的自力更生能力变得越来越重要。评估了可持续模块化自适应冗余技术（SMART），以优化具有给定占地面积的可重构逻辑器件的可靠性，可用性和能源效率。通过蒙特卡罗驱动的连续马尔可夫时间链（CMTC）仿真，与传统的设计时静态三模冗余（TMR）技术相比，利用SMART的运行时适应性来评估可用性。在恶劣的环境中，自适应冗余被证明可以在较长的修复时间下提高系统可用性，在快速恢复时间下提高系统可用性的程度更为显著。与TMR相比，自适应冗余可以节省22%到29%的电力，减少17%到24%的面积成本，同时保持相当的可用性水平。
Self-reliance capabilities of mission-critical systems gain importance as technology scaling and logic capacity of SRAM-based reconfigurable devices increase. The Sustainable Modular Adaptive Redundancy Technique (SMART) is evaluated to optimize the reliability, availability, and energy efficiency of reconfigurable logic devices with a given area footprint. A Monte Carlo driven Continuous Markov Time Chain (CMTC) simulation is conducted to assess availability using runtime adaptation with SMART in comparison to conventional design-time static Triple Modular Redundancy (TMR) techniques. In harsh environments, adaptive redundancy is shown to improve system availability under lengthy repair times, and to a more significant degree under rapid recovery times. When compared to TMR, adaptive redundancy achieves power savings ranging from 22% to 29%, at a reduced area cost ranging from 17% to 24%, while maintaining comparable levels of availability.