Multivariate statistical analysis of three-spatial-dimension TOF-SIMS raw data sets
Multivariate statistical analysis of three-spatial-dimension TOF-SIMS raw data sets
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DOI：
10.1021/ac071019o
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发表时间：
2007-10-15
影响因子：
7.4
通讯作者：
Kotula, P. G.
中科院分区：
文献类型：
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作者：
Smentkowski, V. S.;Ostrowski, S. G.;Kotula, P. G.
如果在深度剖面的每个深度处保存X-Y图像，则可以执行三维空间维（3D）飞行时间二次离子质谱（TOF-SIMS）分析。在本文中，我们将展示如何从指定的深度重建图像，从特定的X-Y坐标生成的深度剖面，以及三维空间渲染提供了一个更好的理解比传统的深度剖析，只有一个单一的光谱收集在每个深度的样品。我们还将首次证明，多变量统计分析（MVSA）工具可用于对整个3D数据集进行快速，无偏分析。在这里显示的示例中，回顾性分析和MVSA显示了比单独测量深度剖面更完整的样品3D化学分布图。将提供MVSA组件的彩色叠加以及动画电影，允许从不同角度进行可视化（3D）。
Three-spatial-dimension (3D) time-of-flight-secondary ion mass spectrometry (TOF-SIMS) analysis can be performed if an X-Y image is saved at each depth of a depth profile. In this paper, we will show how images reconstructed from specified depths, depth profiles generated from specific X-Y coordinates, as well as three-spatial-dimensional rendering provide for a better understanding of the sample than traditional depth profiling where only a single spectrum is collected at each depth. We will also demonstrate, for the first time, that multivariate statistical analysis (MVSA) tools can be used to perform a rapid, unbiased analysis of the entire 3D data set. In the example shown here, retrospective analysis and MVSA revealed a more complete picture of the 3D chemical distribution of the sample than did the as-measured depth profiling alone. Color overlays of the MVSA components as well as animated movies allowing for visualization (in 3D) from various angles will be provided.