Optimization of Device Clocking Schemes to Minimize the Effects of Radiation Damage in Charge-Coupled Devices

Optimization of Device Clocking Schemes to Minimize the Effects of Radiation Damage in Charge-Coupled Devices
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优化器件时钟方案以最大限度地减少电荷耦合器件辐射损伤的影响

DOI:
10.1109/ted.2012.2185240
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发表时间:
2012
影响因子:
3.1
通讯作者:
A. Holland
A. Holland
中科院分区:
工程技术2区
文献类型:
--
作者:
D. Hall;J. Gow;Neil J. Murray;A. Holland

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欧洲航天局欧几里得任务旨在通过绘制黑暗宇宙的地图来回答宇宙如何起源的问题。研究这种几何结构的一种方法是使用像电荷耦合器件(CCD)这样的图像传感器来测量椭圆度的细微变化。然而,空间辐射环境是影响ccd相机系统性能的重要因素。当放置在太空中时,CCD会受到辐射环境的破坏,这可能导致电荷的“涂抹”,从而改变椭圆度,因此,必须能够将辐射损伤引起的椭圆度变化与任务旨在测量的椭圆度变化分开。为此,需要对辐射损伤引起的形状变化进行深入研究,以实现优化操作。蒙特卡罗模拟被用来预测这次撞击,并得到了以前为该任务设定基线的探测器的实验数据的支持。在实验研究期间,对CCD的串行读出进行了调查,以展示通过考虑所涉及的陷阱物种来实现性能优化的方法。发现时钟方案的改变导致电荷转移效率降低了3倍。
The European Space Agency Euclid mission aims to answer the question of how the universe originated through the mapping of the dark Universe. One method to investigate this geometry is to measure subtle changes in ellipticity using image sensors such as the charge-coupled device (CCD). However, the radiation environment in space plays a major part in the performance of CCD-based camera systems. When placed in space, a CCD becomes damaged by the radiation environment, and this can lead to a “smearing” of the charge, acting to change the ellipticity, and therefore, one must be able to separate the changes in ellipticity caused by radiation damage from those the mission aims to measure. To this end, the radiation-damage-induced shape changes require an in-depth investigation such that optimized operation can be achieved. A Monte Carlo simulation is being used to predict this impact, backed by experimental data from a detector formerly baselined for the mission. During the experimental study, an investigation was undertaken into the serial readout of the CCD to demonstrate an approach toward performance optimization through a consideration of the trap species involved. A change in the clocking scheme was found to result in a factor of 3 reduction in charge transfer inefficiency.
对 Euclid CCD 结构中的电荷存储进行建模
DOI: 10.1088/1748-0221/7/01/c01058
发表时间: 2012
影响因子: 1.3
作者:
Clarke A
通讯作者: Clarke A