Dissociation of Highly Charged CS2 Formed by Low Energy Collisions with HCI
Dissociation of Highly Charged CS2 Formed by Low Energy Collisions with HCI
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低能碰撞 HCI 形成高电荷 CS2 的离解
DOI：
10.1238/physica.topical.092a00415
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发表时间：
2001
期刊：
影响因子：
2.9
通讯作者：
N. Kobayashi
中科院分区：
文献类型：
--
作者：
T. Nishide;F. Rajgara;T. Kitamura;H. Shiromaru;Y. Achiba;N. Kobayashi
利用碎片离子的三符合测量结合位置灵敏飞行时间(TOF)探测器技术，研究了Ar6，8+与CS2分子束低能碰撞形成的高电荷态CS2q+离子的爆炸碎裂。对多重电离产生的碎片离子的三维速度矢量的详细分析预测了重建的键角，该键角与中性CS2分子的已知结构合理地一致。
Explosive fragmentation of highly charged CS2q+ ions formed by low energy collision between Ar6,8+ and an effusive molecular beam of CS2 was studied using triple coincidence measurements of the fragment ions combined with a position-sensitive time-of-flight (TOF) detector technique. Detailed analysis of the 3-dimensional velocity vectors of the fragment ions resulting from multiple ionization predicts a reconstructed bond angle that is reasonably consistent with the known structure of the neutral CS2 molecule.