Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems

Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems
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DOI:
10.1117/1.oe.51.11.111702
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发表时间:
2012-11-01
影响因子:
1.3
通讯作者:
Tkaczyk, Tomasz S.
Tkaczyk, Tomasz S.
中科院分区:
工程技术4区
文献类型:
--
作者:
Hagen, Nathan;Kester, Robert T.;Tkaczyk, Tomasz S.

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快照的优点是大大提高了光收集效率,可用于避免过滤和扫描的高维测量系统。在讨论了成像光谱的这一优势之后,在开发快照系统方面做出了最大的努力,我们描述了它适用的测量类型。然后我们将其推广到更大的高维测量环境中,其中优势随着测量维度呈几何级数增加。(C) 2012年中国光学仪器工程师学会。(oe.51.11.111702 DOI: 10.1117/1.)
The snapshot advantage is a large increase in light collection efficiency available to high-dimensional measurement systems that avoid filtering and scanning. After discussing this advantage in the context of imaging spectrometry, where the greatest effort towards developing snapshot systems has been made, we describe the types of measurements where it is applicable. We then generalize it to the larger context of high-dimensional measurements, where the advantage increases geometrically with measurement dimensionality. (C) 2012 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.OE.51.11.111702]