Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems
Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems
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DOI:
10.1117/1.oe.51.11.111702
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发表时间:
2012-11-01
影响因子:
1.3
通讯作者:
Tkaczyk, Tomasz S.
中科院分区:
文献类型:
--
作者:
Hagen, Nathan;Kester, Robert T.;Tkaczyk, Tomasz S.
The snapshot advantage is a large increase in light collection efficiency available to high-dimensional measurement systems that avoid filtering and scanning. After discussing this advantage in the context of imaging spectrometry, where the greatest effort towards developing snapshot systems has been made, we describe the types of measurements where it is applicable. We then generalize it to the larger context of high-dimensional measurements, where the advantage increases geometrically with measurement dimensionality. (C) 2012 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.OE.51.11.111702]