GHz-range SAW device using nano-meter electrode fabrication technology
GHz-range SAW device using nano-meter electrode fabrication technology
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采用纳米电极制造技术的 GHz 范围 SAW 器件
DOI:
10.1109/ultsym.1994.401622
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发表时间:
1994
期刊:
影响因子:
--
通讯作者:
K. Yamanouchi
中科院分区:
文献类型:
--
作者:
K. Yamanouchi
Nano-meter lithography technology is very important for high density integrated circuits and higher frequency-range SAW devices. The frequency ranges of mobile communication systems are now in the 1 GHz region and extending to 2-4 GHz. Moreover SAW devices require a frequency range of around 10 GHz. Nano-meter technology below 0.1 μm is required. In this paper, nano-meter fabrication processing with various types of fine lithography technology, electrode fabrication for GHz SAW devices and low-loss filters using unidirectional transducers are described, The lift-off lithography techniques for a 10 GHz SAW IDT using direct wafer electron beam writing are shown. Next, new lithography techniques are reported for a 0.05 μm width IDT with thickness of about 0.03 μm on 128° Y-X LiNbO3. SAW experimental results on 10 GHz-range SAW conventional interdigital transducers and filters with an insertion loss of around 15 dB are shown. GHz-range SAW devices, low-loss filters and signal processing are also described