Understanding the evolution of radiation damage on the Gaia CCDs after 72 months at L2
Understanding the evolution of radiation damage on the Gaia CCDs after 72 months at L2
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DOI：
10.1117/1.jatis.8.1.016003
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发表时间：
2022-01
期刊：
影响因子：
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通讯作者：
Saad Ahmed;D. Hall;C. Crowley;J. Skottfelt;B. Dryer;G. Seabroke;J. Hernández;A. Holland
中科院分区：
文献类型：
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作者：
Saad Ahmed;D. Hall;C. Crowley;J. Skottfelt;B. Dryer;G. Seabroke;J. Hernández;A. Holland
抽象的。欧洲航天局的盖亚航天器自2013年12月发射以来一直在L2运行，有效载荷包括106个科学电荷耦合器件（CCD）。由于在飞行前测试阶段预测的辐射环境以及科学目标所要求的高精度，探测器上的非电离能量损失（NIEL）损坏被确定为可能影响使命科学目标的一个主要因素。在这里，我们提出了一套扩展的电荷校准数据的分析，采取了近六年后发射。发现CCD的辐射损伤累积率与以前的结果没有显著差异。虽然并行和串行CTI测量时间的增加，陷阱缺陷景观仍然是占主导地位的飞行前的缺陷，而不是辐射诱导的陷阱。预计具有较低NIEL剂量的CCD装置测量相对较大的CTI增加率。除此之外，与较薄的器件相比，较厚的器件已被测量为具有较低的串行CTI值。最初的平行CTI值也被发现是依赖于生产年份。
Abstract. The European Space Agency’s Gaia spacecraft has been operating in L2 ever since its launch in December 2013 with a payload that includes 106 scientific charge-coupled devices (CCDs). Due to the predicted radiation environment at the pre-flight testing stage in addition to the high level of accuracy demanded by the science objectives, the non-ionizing energy loss (NIEL) damage on the detectors was identified as a major factor that could affect the science goals of the mission. Here, we present the analysis of an extended set of charge calibration data, taken up to almost six years after launch. It is found that the rate of radiation damage accumulation by the CCDs has not differed significantly from previous results. While the parallel and serial CTI measure an increase in time, the trap defect landscape is still dominated by the pre-flight defects rather than the radiation-induced traps. CCD devices that were predicted to have a lower NIEL dose measure comparatively larger rates of CTI increase. In addition to this, thicker devices have been measured to have lower serial CTI values compared to thinner devices. The initial parallel CTI values have also been found to be dependent on manufacture year.