Transition Detector-Based Radiation-Hardened Latch for Both Single- and Multiple-Node Upsets
Transition Detector-Based Radiation-Hardened Latch for Both Single- and Multiple-Node Upsets
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DOI：
10.1109/tcsii.2019.2926498
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发表时间：
2020-06-01
影响因子：
4.4
通讯作者：
Shi, Youhua
中科院分区：
文献类型：
--
作者：
Tajima, Saki;Yanagisawa, Masao;Shi, Youhua
本文简要介绍了一种基于输出转换探测器的抗辐射锁存器(TDRHL)，以提高可靠性。利用错误恢复辅助逻辑和原位转换检测器，对于任何辐射引起的单节点和双节点扰动，所提出的TDRHL可以1)提供完全的自恢复能力，2)当软错误导致锁存器输出反转时，产生用于体系结构级恢复的警告信号。评估结果表明，TDRHL比目前最先进的双节点翻转容错设计具有更高的检错能力，并且可以获得高达5.0倍的功率延迟乘积改善。
This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single- and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art double-node upset tolerant designs with addition error detection capability, and up to 5.0X power-delay-product improvement can be achieved.