Getting Started with NIST* DTSA-II
Getting Started with NIST* DTSA-II
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NIST* DTSA-II 入门
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
N. Ritchie
中科院分区：
文献类型：
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作者：
N. Ritchie
自2007年推出以来，DTSA-II已被许多研究人员采用，并已被纳入许多教育计划。这是《今日显微镜》系列文章中的第一篇，该系列文章将在未来几个月内出现，介绍该产品的使用。这些文章还将详细介绍DTSA-II如何用于在实验室或教学环境中实施微量分析的最佳实践。这些文章将演示如何形成最准确的光谱定量类型-标准品定量-以及如何使用模拟来优化各种类型的测量问题。他们将专注于使用DTSA-II来了解物理过程，包括高能电子与样品的相互作用以及X射线通过物质传播到探测器的过程。
Since its introduction in 2007, DTSA-II has been adopted by numerous researchers, and it has been integrated into numerous educational programs. This is the first of a series of articles in Microscopy Today that will appear in the upcoming months to provide an introduction to use of the product. These articles also will provide details of how DTSA-II can be used to implement best practices for microanalysis in your laboratory or in your teaching environment. These articles will demonstrate how to form the most accurate type of spectrum quantification—standards-base quantification—as well as how to use simulation to optimize various types of measurement problems. They will focus on using DTSA-II to understand the physical process including the interaction of energetic electrons with your sample and the propagation of x-rays through matter and to the detector.