Adaptive optics for structured illumination microscopy
Adaptive optics for structured illumination microscopy
复制标题
DOI：
10.1364/oe.16.009290
复制
发表时间：
2008-06-23
期刊：
影响因子：
3.8
通讯作者：
Wilson, Tony
中科院分区：
文献类型：
--
作者：
Debarre, Delphine;Botcherby, Edward J.;Wilson, Tony
我们在结构照明显微镜上实现了波前无传感器自适应光学系统。我们研究了像差对这类显微镜成像过程的影响。研究发现，像差可以分为两类，一类是影响照明图案成像的像差，另一类是对该图案没有影响的像差。我们推导出一组理想地适合于这种应用的像差模式，并使用这些模式作为有效的像差校正方案的基础。通过图像质量度量的顺序优化独立地校正每个模式。使用固定的荧光样本演示了像差校正成像。利用差动像差成像进一步改善图像，以减少背景荧光。(C)2008年美国光学学会。
We implement wave front sensor-less adaptive optics in a structured illumination microscope. We investigate how the image formation process in this type of microscope is affected by aberrations. It is found that aberrations can be classified into two groups, those that affect imaging of the illumination pattern and those that have no influence on this pattern. We derive a set of aberration modes ideally suited to this application and use these modes as the basis for an efficient aberration correction scheme. Each mode is corrected independently through the sequential optimisation of an image quality metric. Aberration corrected imaging is demonstrated using fixed fluorescent specimens. Images are further improved using differential aberration imaging for reduction of background fluorescence. (C) 2008 Optical Society of America.