A 1.2V 12.8GB/s 2Gb mobile Wide-I/O DRAM with 4×128 I/Os using TSV-based stacking
A 1.2V 12.8GB/s 2Gb mobile Wide-I/O DRAM with 4×128 I/Os using TSV-based stacking
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DOI:
10.1109/isscc.2011.5746413
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发表时间:
2011
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通讯作者:
Jung-Sik Kim;C. Oh;Hocheol Lee;Donghyuk Lee;H. Hwang;S. Hwang;Byongwook Na;Joungwook Moon;Jin-Guk Kim;Hanna Park;Jang-Woo Ryu;Kiwon Park;Sanghee Kang;So-Young Kim;Hoyoung Kim;Jong-Min Bang;Hyunyoon Cho;M. Jang;C. Han;Jung-Bae Lee;K. Kyung;Joo-Sun Choi;Young-Hyun Jun
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文献类型:
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作者:
Jung-Sik Kim;C. Oh;Hocheol Lee;Donghyuk Lee;H. Hwang;S. Hwang;Byongwook Na;Joungwook Moon;Jin-Guk Kim;Hanna Park;Jang-Woo Ryu;Kiwon Park;Sanghee Kang;So-Young Kim;Hoyoung Kim;Jong-Min Bang;Hyunyoon Cho;M. Jang;C. Han;Jung-Bae Lee;K. Kyung;Joo-Sun Choi;Young-Hyun Jun
Mobile DRAM is widely employed in portable electronic devices due to its feature of low power consumption. Recently, as the market trend renders integration of various features in one chip, mobile DRAM is required to have not only low power consumption but also high capacity and high speed. To attain these goals in mobile DRAM, we designed a 1Gb single data rate (SDR) Wide-I/O mobile SDRAM with 4 channels and 512 DQ pins, featuring 12.8GB/s data bandwidth.