Probing the Internal Microstructure of Polyamide Thin-Film Composite Membranes Using Resonant Soft X-ray Scattering.
Probing the Internal Microstructure of Polyamide Thin-Film Composite Membranes Using Resonant Soft X-ray Scattering.
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使用共振软 X 射线散射探测聚酰胺薄膜复合膜的内部微观结构。
DOI：
10.1021/acsmacrolett.8b00301
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发表时间：
2018
影响因子：
7.015
通讯作者：
Enrique D. Gomez
中科院分区：
文献类型：
--
作者：
Tyler E. Culp;Dan Ye;M. Paul;Abhishek Roy;M. Behr;S. Jons;Steve Rosenberg;Cheng Wang;Esther W. Gomez;Manish Kumar;Enrique D. Gomez
表征用于反渗透(RO)的薄膜复合膜的内部形态是了解微结构与水传输性能之间关系的前提，也是设计具有更高性能的膜所必需的。在这里，我们使用共振软X射线散射(RSoXS)、透射电子显微镜(TEM)和原子力显微镜(AFM)相结合的方法来研究一系列全芳香族聚酰胺反渗透膜的活性层，这些层在交联过程中会发生变化。RSoXS谱分析揭示了膜结构与交联度之间的关系。通过结合散射对比度计算、电子显微镜和原子力显微镜显微照片，我们认为对RSoXS数据的主要贡献是表面粗糙度或化学不均匀，这取决于所使用的X射线能量。综上所述，我们的结果证明了软X射线散射在检测水滤膜微结构方面的有效性。
Characterization of the internal morphology of thin film composite membranes used in reverse osmosis (RO) is a prerequisite for understanding the connection between microstructure and water transport properties and is necessary for the design of membranes with improved performance. Here, we examine a series of fully aromatic polyamide active layers of RO membranes that vary in crosslinking using a combination of resonant soft X-ray scattering (RSoXS), transmission electron microscopy (TEM), and atomic force microscopy (AFM). Analysis of RSoXS profiles reveals a correlation between membrane structure and crosslinking density. Through a combination of scattering contrast calculations, TEM, and AFM micrographs, we assign the dominant contribution to RSoXS data as either surface roughness or chemical heterogeneity, depending on the X-ray energy used. Altogether, our results demonstrate the utility of soft X-ray scattering to examine the microstructure of water filtration membranes.
影响因子：
41.2
作者：
Collins, B. A.;Cochran, J. E.;Ade, H.
通讯作者：
Ade, H.