Bidirectional quantitative force gradient microscopy
Bidirectional quantitative force gradient microscopy
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DOI：
10.1088/1367-2630/17/1/013014
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发表时间：
2015-01-09
影响因子：
3.3
通讯作者：
Muehl，Thomas
中科院分区：
文献类型：
--
作者：
Reiche，Christopher F.;Vock，Silvia;Muehl，Thomas
基于探针共振频率检测的扫描力显微镜动态工作模式是研究高空间分辨率表面力相关特性的一种非常成功的方法。有公认的方法来测量垂直力分量以及对横向力分量敏感的设置。在这里，我们报告的概念，双向力梯度显微镜，使一个直接的，快速的，和定量的真实的空间映射力分量的衍生物在垂直和横向方向。它完全依赖于与垂直探头激励和垂直偏转感测相关的多模式弯曲悬臂振荡。探索这一概念，我们提出了一个基于MEMS的传感器设置和相应的定量测量，采用静磁相互作用，重点是计算模式相关的弹簧常数，定量力梯度研究的基础。
Dynamic operation modes of scanning force microscopy based on probe resonance frequency detection are very successful methods to study force-related properties of surfaces with high spatial resolution. There are well-recognized approaches to measure vertical force components as well as setups sensitive to lateral force components. Here, we report on a concept of bidirectional force gradient microscopy that enables a direct, fast, and quantitative real space mapping of force component derivatives in both the perpendicular and a lateral direction. It relies solely on multiple-mode flexural cantilever oscillations related to vertical probe excitation and vertical deflection sensing. Exploring this concept we present a cantilever-based sensor setup and corresponding quantitative measurements employing magnetostatic interactions with emphasis on the calculation of mode-dependent spring constants that are the foundation of quantitative force gradient studies.