Modeling of the gate-controlled Kondo effect at carbon point defects in graphene

Modeling of the gate-controlled Kondo effect at carbon point defects in graphene
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DOI:
10.1103/physrevb.97.155419
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发表时间:
2018-04-18
期刊:
影响因子:
3.7
通讯作者:
Anders, Frithjof B.
Anders, Frithjof B.
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
May, Daniel;Lo, Po-Wei;Anders, Frithjof B.

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