Fluence thresholds for grazing incidence hard x-ray mirrors
Fluence thresholds for grazing incidence hard x-ray mirrors
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DOI：
10.1063/1.4922380
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发表时间：
2015-06
影响因子：
4
通讯作者：
A. Aquila;R. Sobierajski;C. Ozkan;V. Hájková;T. Burian;J. Chalupský;L. Juha;M. Störmer;S. Bajt;M. Klepka;P. Dłużewski;K. Morawiec;H. Ohashi;T. Koyama;K. Tono;Y. Inubushi;M. Yabashi;H. Sinn;T. Tschentscher;A. Mancuso;J. Gaudin
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文献类型：
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作者：
A. Aquila;R. Sobierajski;C. Ozkan;V. Hájková;T. Burian;J. Chalupský;L. Juha;M. Störmer;S. Bajt;M. Klepka;P. Dłużewski;K. Morawiec;H. Ohashi;T. Koyama;K. Tono;Y. Inubushi;M. Yabashi;H. Sinn;T. Tschentscher;A. Mancuso;J. Gaudin
X射线自由电子激光器（XFEL）有潜力为许多科学领域做出贡献，并使许多新的研究途径成为可能，这在很大程度上是因为它们的峰值亮度比现有和未来的同步加速器高出几个数量级。为了最好地利用这种峰值亮度，这些XFEL光束需要聚焦到适当的光斑大小。然而，X射线光学元件在这些强烈的飞秒辐射条件下的生存能力并不能得到保证。由于反射镜光学系统经常用于XFEL设施，强烈的X射线脉冲和掠入射X射线光学之间的相互作用的物理理解是可取的。我们进行了单发损伤阈值通量测量掠入射X射线光学，涂层的钌和碳化硼，在SPring-8埃紧凑型自由电子激光设备，使用7和12千电子伏的光子能量。损伤阈值剂量限值被发现是数量级高于天真的预期。通过千电子伏级高能光电子的能量传输和耗散的纳入占所观察到的损伤阈值。
X-ray Free Electron Lasers (XFELs) have the potential to contribute to many fields of science and to enable many new avenues of research, in large part due to their orders of magnitude higher peak brilliance than existing and future synchrotrons. To best exploit this peak brilliance, these XFEL beams need to be focused to appropriate spot sizes. However, the survivability of X-ray optical components in these intense, femtosecond radiation conditions is not guaranteed. As mirror optics are routinely used at XFEL facilities, a physical understanding of the interaction between intense X-ray pulses and grazing incidence X-ray optics is desirable. We conducted single shot damage threshold fluence measurements on grazing incidence X-ray optics, with coatings of ruthenium and boron carbide, at the SPring-8 Angstrom compact free electron laser facility using 7 and 12 keV photon energies. The damage threshold dose limits were found to be orders of magnitude higher than would naively be expected. The incorporation of energy transport and dissipation via keV level energetic photoelectrons accounts for the observed damage threshold.