The SMILE Soft X-ray Imager (SXI) CCD design and development
The SMILE Soft X-ray Imager (SXI) CCD design and development
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SMILE 软 X 射线成像仪 (SXI) CCD 设计和开发
DOI：
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发表时间：
2018
期刊：
影响因子：
--
通讯作者：
C. Woffinden
中科院分区：
文献类型：
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作者：
M. Soman;D. Hall;A. Holland;R. Burgon;T. Buggey;J. Skottfelt;S. Sembay;P. Drumm;J. Thornhill;A. Read;J. Sykes;D. Walton;G. Branduardi‐Raymont;T. Kennedy;W. Raab;P. Verhoeve;D. Agnolon;C. Woffinden
SMILE，太阳风磁层电离层链路探测器，是欧洲航天局和中国科学院之间的一项联合科学使命。该航天器将配备独特的设备，以研究地球磁层-电离层系统与太阳风之间在全球范围内的相互作用。SMILE的仪器将通过对向阳面磁鞘太阳风电荷交换软X射线发射成像、同时对紫外线北方极光成像以及对太阳风和磁鞘等离子体和磁场状况进行现场监测来探索这一科学。软X射线成像仪（SXI）是设计用来观测太阳风电荷交换过程中发射的X射线光子的仪器，光子能量在200 eV至2000 eV之间。将使用两个定制设计CCD的焦平面阵列收集X射线，每个CCD由4510 x 4510阵列中的18 μm方形像素组成。SMILE将被放置在一个高度椭圆的极地轨道上，每48小时进出地球的辐射带。在使命的3年标称寿命期间，CCD中累积的辐射损伤将降低其性能（例如通过降低电荷转移效率），从而对仪器探测入射到CCD图像区域中距离探测器输出最远的区域的低能X射线的能力产生负面影响。本文介绍了SMILE-SXI CCD的设计，包括减轻辐射损伤影响的功能和操作方法，以及预期的寿命终止CCD性能。使用未针对软X射线信号电平设计的PLATO设备进行的测量表明，对于5.9 keV光子，在预期寿命结束时，温度依赖的传输效率性能在5×10−5和9×10−4之间变化，给出了一组初始测量值，可以从中推断SXI CCD的性能。
SMILE, the Solar wind Magnetosphere Ionosphere Link Explorer, is a joint science mission between the European Space Agency and the Chinese Academy of Sciences. The spacecraft will be uniquely equipped to study the interaction between the Earth's magnetosphere-ionosphere system and the solar wind on a global scale. SMILE's instruments will explore this science through imaging of the solar wind charge exchange soft X-ray emission from the dayside magnetosheath, simultaneous imaging of the UV northern aurora and in-situ monitoring of the solar wind and magnetosheath plasma and magnetic field conditions. The Soft X-ray Imager (SXI) is the instrument being designed to observe X-ray photons emitted by the solar wind charge exchange process at photon energies between 200 eV and 2000 eV . X-rays will be collected using a focal plane array of two custom-designed CCDs, each consisting of 18 μm square pixels in a 4510 by 4510 array. SMILE will be placed in a highly elliptical polar orbit, passing in and out of the Earth's radiation belts every 48 hours. Radiation damage accumulated in the CCDs during the mission's nominal 3-year lifetime will degrade their performance (such as through decreases in charge transfer efficiency), negatively impacting the instrument's ability to detect low energy X-rays incident on the regions of the CCD image area furthest from the detector outputs. The design of the SMILE-SXI CCDs is presented here, including features and operating methods for mitigating the effects of radiation damage and expected end of life CCD performance. Measurements with a PLATO device that has not been designed for soft X-ray signal levels indicate a temperature-dependent transfer efficiency performance varying between 5×10−5 and 9×10−4 at expected End of Life for 5.9 keV photons, giving an initial set of measurements from which to extrapolate the performance of the SXI CCDs.
CCD 的多级并行时钟用于：提高电荷传输效率、清除持久性、时钟防晕以及生成用于泵浦的低噪声背景
DOI：
10.1117/12.2024839
发表时间：
2013
期刊：
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影响因子：
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作者：
Murray N
通讯作者：
Murray N
对 Euclid CCD 结构中的电荷存储进行建模
影响因子：
1.3
作者：
Clarke A
通讯作者：
Clarke A