ARPES and STM view of heavy-electron quantum criticality: perspectives and challenges
ARPES and STM view of heavy-electron quantum criticality: perspectives and challenges
复制标题
ARPES 和 STM 的重电子量子临界性观点:前景和挑战
DOI:
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发表时间:
2018-10
期刊:
影响因子:
--
通讯作者:
Qimiao Si
中科院分区:
文献类型:
--
作者:
Stefan Kirchner;Silke Paschen;Qiuyun Chen;Steffen Wirth;Donglai Feng;Joe D. Thompson;Qimiao Si
Angle resolved photoemission spectroscopy (ARPES) and scanning tunneling microscopy (STM) have become indispensable tools in the study of correlated quantum matter. Both probe complementary aspects of the single-particle excitation spectrum. Taken together, ARPES and STM have the potential to explore properties of the electronic Green function, a central object of many-body theory. In this article, we explicate this potential with a focus on heavy-electron quantum criticality, especially the role of Kondo destruction. We discuss how to probe the Kondo destruction effect across the quantum critical point using ARPES and STM measurements. We place particular emphasis on the question of how to distinguish between the signatures of the initial onset of hybridization-gap formation, which is the "high-energy" physics to be expected in all heavy electron systems, and those of Kondo destruction, which characterizes the nature of quantum criticality. We survey the recent progresses and possible challenges in the experimental measurements, compare the STM and ARPES spectra for several quantum-critical heavy-electron compounds, and outline the prospects for further progresses.
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DOI:
10.1073/pnas.2001778117
发表时间:
2020-09-22
影响因子:
11.1
作者:
Jang, Sooyoung;Denlinger, J. D.;Shim, Ji Hoon
通讯作者:
Shim, Ji Hoon
DOI:
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发表时间:
2018
期刊:
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影响因子:
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作者:
Y. Komijani;P. Coleman
通讯作者:
Y. Komijani;P. Coleman
DOI:
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发表时间:
2019-04
期刊:
arXiv: Strongly Correlated Electrons
影响因子:
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作者:
A. Cai;Haoyu Hu;K. Ingersent;S. Paschen;Q. Si
通讯作者:
A. Cai;Haoyu Hu;K. Ingersent;S. Paschen;Q. Si
DOI:
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发表时间:
2016
期刊:
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影响因子:
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作者:
D. Abend
通讯作者:
D. Abend
DOI:
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发表时间:
1999
期刊:
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影响因子:
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作者:
S. Kimura;H. Okamura;T. Nanba;M. Ikezawa;F. Iga;N. Shimizu;T. Takabatake
通讯作者:
S. Kimura;H. Okamura;T. Nanba;M. Ikezawa;F. Iga;N. Shimizu;T. Takabatake