Field Guide to Optical Lithography
Field Guide to Optical Lithography
复制标题
光学光刻现场指南
DOI:
10.1117/3.665802
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发表时间:
2006
期刊:
影响因子:
--
通讯作者:
C. Mack
中科院分区:
文献类型:
--
作者:
C. Mack
Phase-Shift Masks Phase-shift masks (PSMs) work by adding phase information to the mask in addition to amplitude information. A binary chrome-on-glass mask encodes the information about where to position resist edges using chrome (with zero amplitude transmittance) and glass (with 100% amplitude transmittance). A phase-shift mask relies on the fact that light passing through a transparent media will undergo a phase change as a function of its optical thickness, the refractive index times the physical thickness. Thus, light passing through a certain thickness of quartz will have a different phase transmittance than light passing through the same thickness of air. By adjusting the thickness of the quartz, any phase difference can be obtained.By setting the phase shift to be 180, high-resolution imaging with good depth of focus can be obtained. Light from shifted and unshifted parts of the mask, when combined, will interfere and cancel out at the image plane due to the 180 phase shift. If the shifted and unshifted light is of equal quantity the cancellation will be complete. Phase-Shift Masks A 0–180 phase edge on a mask will print as a narrow dark line. An array of these edges will print patterns of lines and spaces with widths as low as 0.25 λ/NA. Common types of PSMs are alternating (pictured here) and attenuated PSMs. Practical implementation of PSMs is limited by phase termination problems and mask fabrication difficulties.