Error-Correcting Locating Arrays for Interaction Fault Location in Combinatorial Testing
Error-Correcting Locating Arrays for Interaction Fault Location in Combinatorial Testing
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DOI：
10.1109/isit50566.2022.9834368
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发表时间：
2022-06
期刊：
影响因子：
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通讯作者：
Xiaonan Lu;Masakazu Jimbo
中科院分区：
文献类型：
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作者：
Xiaonan Lu;Masakazu Jimbo
提出了一个新的概念，错误校正的定位阵列（ECLA），用于使用组合测试在基于组件的系统中定位交互故障。讨论了常用的组合阵列的错误公差，例如覆盖阵列和定位阵列等测试。此外，提出了编码理论特征和ECLA的构造。最后，结果表明，多值Paley矩阵可以用作具有高误差公差的ECLA，其证明基于有限字段中的字符总和。
A new notion, error-correcting locating arrays (ECLAs), is presented for locating interaction faults in component-based systems using combinatorial testing. Error tolerances of commonly used combinatorial arrays for testing such as covering arrays and locating arrays are discussed. Moreover, coding-theoretic characterization and constructions for ECLAs are proposed. Lastly, it is shown that multi-value Paley matrices can be used as ECLAs with high error tolerances for which the proof is based on character sums in finite fields.