S.Enami: "Fractal Pattern Formation Because of Annealing of Au/amorphous-Ge Bilayer Film Deposited on a SiO_2 Substrate"Proc.of the Fourth Pacific Rim International Conference on Advanced Materials and Processing(PRICM 4). 2531-2534 (2001)

S.Enami：“Fractal Pattern Formationbecause of Annealing of Au/amorphous-Ge Bilayer Film Deposited on a SiO_2 Substrate”Proc.of the Fourth Rim Pacific Rim International Conference on Advanced Materials and Handling(PRICM 4)。