Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis

Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis
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通过电子探针微量分析提高石英中 Al 和 Ti 痕量元素分析的准确性

DOI:
10.1017/s1431927618015672
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发表时间:
2019-02
影响因子:
2.8
通讯作者:
Xie Jing
Xie Jing
中科院分区:
工程技术4区
文献类型:
--
作者:
Cui Ji-Qiang;Yang Shui-Yuan;Jiang Shao-Yong;Xie Jing

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石英中的微量元素Al和Ti含有丰富的成矿信息,测定它们的含量具有重要的地质意义。电子探针微区分析具有无损检测和高空间分辨率的优点,但如何提高微量元素检测的准确度和精密度是一个挑战。影响准确度的重要因素包括石英晶格在高束流下的脆弱性和用于确定背景的方法。在本文中,发现Al-Kα和Ti-Kα的峰及其背景在高束流和小束直径下表现出强度变化;因此,有必要选择大束直径(高达20 µm),以避免在高电流(500 nA)下强度变化。对于铝的背景测定,提出了多点背景法测定背景值,大大提高了结果的准确性。对于Ti,背景测量的选择不影响结果。此外,验证了从其他石英样品获得的背景可以用作未知石英样品的背景,这减少了分析时间,并最大限度地减少了样品损坏。
Abstract The trace elements in quartz, Al and Ti, contain considerable information about mineral genesis, and determining their concentrations is of great importance in geology. Electron probe microanalysis has the advantages of non-destructive testing and high spatial resolution; however, it is a challenge to improve the accuracy and precision of trace element detection using this method. The important factors affecting accuracy include the fragility of quartz lattices at high beam currents and the methods used to determine the background. In this paper, the peaks of Al-Kα and Ti-Kα, and their backgrounds, were found to exhibit intensity variations at high beam currents and small beam diameters; therefore, it is necessary to select a large beam diameter (up to 20 µm) to avoid variations in intensity at high currents (500 nA). For background determination of Al, a multipoint background method is proposed to determine the background value, which greatly improves the accuracy of the results. For Ti, the choice of background measurement does not affect the result. In addition, it is verified that the background obtained from other quartz samples can be used as the background of an unknown quartz sample, which reduces the analysis time and minimizes sample damage.
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