Interface modeling in Cr/Fe/Cr sandwiches studied by CEMS
Interface modeling in Cr/Fe/Cr sandwiches studied by CEMS
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DOI：
10.1016/s0042-207x(01)00210-x
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发表时间：
2001-07-02
期刊：
影响因子：
4
通讯作者：
Korecki, J
中科院分区：
文献类型：
--
作者：
Kubik, M;Slezak, T;Korecki, J
用转换电子穆斯堡尔谱（CEMS）模拟了外延1-14单层（ML）中的埋层界面。Fe（0 0 1）膜夹在Cr（0 0 1）层之间。通过对80 K GEMS谱测定的超精细场分布的实验分析，导出了Fe和Cr的局域排列。6 ML Fe膜的磁性能的不连续性表明在此厚度下发生磁结构的修改。Fe-57探针层分析表明，Cr/Fe和Fe/Cr界面是不等效的。下界面比上界面更光滑。从GEMS分析中得到的Fe浓度分布显示出在室温下沉积的膜的相当大的界面Fe-Cr合金化。(C)2001爱思唯尔科技有限公司版权所有。
Conversion electron Mossbauer spectroscopy (CEMS) was applied to model the buried interfaces in epitaxial 1-14 monolayer (ML.) Fe(0 0 1) films sandwiched between Cr(0 0 1) layers. The local arrangement of Fe and Cr was derived by analysis of the experimental hyperfine field distributions determined from 80 K GEMS spectra. A discontinuity in magnetic properties fur the 6 ML Fe film suggests that a modification of the magnetic structure occurs at this thickness. The Fe-57 probe layer analysis showed that Cr/Fe and Fe/Cr interfaces are non-equivalent. The lower interface showed up to be smoother than the upper one. The Fe concentration profile obtained, form the GEMS analysis displayed a considerable Interface Fe-Cr alloying for films deposited at the room temperature. (C) 2001 Elsevier Science Ltd. All rights reserved.