Edge transfer lithography using alkanethiol inks
Edge transfer lithography using alkanethiol inks
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DOI:
10.1021/nl0607885
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发表时间:
2006-06-01
期刊:
影响因子:
10.8
通讯作者:
Poelsema, Bene
中科院分区:
文献类型:
--
作者:
Sharpe, Ruben B. A.;Titulaer, Bram J. F.;Poelsema, Bene
Edge lithographic patterning techniques are based on the utilization of the edges of micrometer-sized template features for the reproduction of submicrometer structures. Edge transfer lithography (ETL) permits local surface modification in a single step by depositing self-assembled monolayers onto a metal substrate selectively along the feature edges of an elastomeric stamp. In this report two stamp designs are described that now allow for the use of alkanethiol inks in ETL and their use as etch resists to reproduce submicrometer structures in gold. Anisotropically modified stamps are shown to combine the potential for very high-resolution patterning with the versatility and simplicity of microcontact printing.