Effects of magnetic shear on electron cyclotron resonance heating in heliotron/torsatron configurations
Effects of magnetic shear on electron cyclotron resonance heating in heliotron/torsatron configurations
复制标题
磁剪切对日光加速器/托萨加速器配置中电子回旋加速器共振加热的影响
DOI：
10.1063/1.873200
复制
发表时间：
1999
影响因子：
2.2
通讯作者：
K. Kondo
中科院分区：
文献类型：
--
作者：
K. Nagasaki;A. Ejiri;T. Mizuuchi;T. Obiki;H. Okada;F. Sano;H. Zushi;S. Besshou;K. Kondo
研究了磁剪切力对电子回旋共振加热(ECRH)的影响。在这样的构型中，极向磁场与环向磁场相当，并且在空间上沿小半径变化，产生强烈的磁切变。当高功率毫米波被发射到等离子体中时，它被耦合到等离子体外围区域的传播模式。在磁芯等离子体区和真空区之间存在过渡层，磁场方向变化很大，这就需要精确的偏振控制才能获得良好的单程吸收。由于磁切变引起的传播模式之间的模式转换也影响发射条件。二次谐波ECRH在氦加速器E中的偏振控制实验[T.Obiki，Fusion Technol.17,101(1990)]，与求解一维二阶耦合方程的数值计算结果进行了比较。实验测得的偏振依赖关系与包括磁剪切项在内的数值结果符合得很好。
Effects of magnetic shear on electron cyclotron resonance heating (ECRH) are studied in heliotron/torsatron configurations. In such configurations, the poloidal magnetic field is comparable to the toroidalmagnetic field, and varies spatially along the minor radius, making a strong magnetic shear. When high power millimeter waves are launched into a plasma, it is coupled to propagating modes at the plasma peripheral region. The existence of a transition layer between the core plasma region and the vacuum region, where the magnetic field direction is largely changed, requires accurate polarization control for good single pass absorption. The mode conversion between the propagation modes due to the magnetic shear also affects the launching conditions. The polarization control experiment by using second harmonic ECRH in Heliotron E [T. Obiki, Fusion Technol. 17, 101 (1990)] are compared with the numerical calculation in which one dimensional second order coupled equations are solved. The polarization dependence experimentally measured is in good agreement with the numerical results including the magnetic shear terms.
影响因子：
3.3
作者：
A. Gibson;T. Sekiguchi;K. Lackner;S. Bodner;R. Hancox
通讯作者：
A. Gibson;T. Sekiguchi;K. Lackner;S. Bodner;R. Hancox
Heliotron I 的 70 GHz 电子回旋共振加热系统
DOI：
--
发表时间：
2004
期刊：
Fusion Science and Technology 45
影响因子：
--
作者：
Yoshida;H.;H.Shidara
通讯作者：
H.Shidara