Enhanced Nonlinear Refractive Index of C-Rich SiC Waveguides Via Annealing for PRZ-OOK Data Transmission
Enhanced Nonlinear Refractive Index of C-Rich SiC Waveguides Via Annealing for PRZ-OOK Data Transmission
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DOI:
10.1109/jstqe.2018.2846021
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发表时间:
2018-11-01
影响因子:
4.9
通讯作者:
Lin, Gong-Ru
中科院分区:
文献类型:
--
作者:
Hsieh, Cheng-Hsuan;Cheng, Chih-Hsien;Lin, Gong-Ru
The C-rich SiCx with enhanced optical nonlinearity is employed to fabricate ring waveguides to perform picosecond optical switching of pulsed data streams under the wavelength conversion scheme. The C-rich SiCx film after 60-minute annealing exhibits abundant graphite-like (sp(2)-like) C-C bonds resulting in the increase of its Kerr coefficient. Under transverse electric mode polarized pump-probe analysis, the continuous-wave transmittance comb spectrum of the C-rich SiCx-based ring waveguide shows a higher Q-factor than for transverse magnetic mode analysis. The red-shift of the transmission comb under a peak pumping power of 4.3 W increases from 0.12 to 0.14 nm as the nonlinear refractive index of the C-rich SiCx increases from 1.37 x 10(-12) to 2.38 x 10(-12) cm(2)/W through increasing the annealing time from 0 to 60 min. The picosecond optical switching of pulsed bit data in the C-rich SiCx ring waveguide provides an optimized extinction ratio (ER), a signal-to-noise ratio (SNR), and a bit-error rate (BER) of 8.1 dB, 8.2 dB, and 1.7 x 10(-11), respectively. After matching the probe wavelength with the red-shifted transmittance comb, the wavelength-converted data shows an inverted format with optimized ER, SNR, and BER of 7.9 dB, 8.1 dB, and 7.8 x 10(-10), respectively. The annealing regrown C-rich SiCx can perform better nonlinear optical switching than reported so far for ultrafast data processing in photonic integrated circuits.