Effect of radiation trapping on fluorescence lifetime and emission cross section measurements in solid-state laser media.
Effect of radiation trapping on fluorescence lifetime and emission cross section measurements in solid-state laser media.
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DOI：
10.1364/ol.19.001343
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发表时间：
1994-09
期刊：
影响因子：
3.6
通讯作者：
D. Sumida;T. Fan
中科院分区：
文献类型：
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作者：
D. Sumida;T. Fan
辐射捕获导致显着延长测量的荧光寿命在光学薄的固态激光增益介质，这导致低估的受激发射截面高达30%。测量技术表明，大大减少了Yb：YAG，一个典型的准三能级激光介质中的辐射陷阱。在300 K下测得（2）F（5/2）流形的辐射寿命为0.951 ms，比以前的任何测量值都低10%以上。这个更精确的辐射寿命给出了1.03微米的峰值有效受激发射截面为2.3 × 10（-20）cm（2）。我们的测量技术预计是最相关的三能级和准三能级激光介质。
Radiation trapping causes significant lengthening of the measured fluorescence lifetime in optically thin solid-state laser gain media, which leads to underestimates of the stimulated emission cross section by as much as 30%. A measurement technique is demonstrated that greatly reduces radiation trapping in Yb:YAG, a prototypical quasi-three-level laser medium. The radiative lifetime of the (2)F(5/2) manifold was measured to be 0.951 ms at 300 K, which is more than 10% lower than any previous measurement. This more-accurate radiative lifetime gives a 1.03-microm peak effective stimulated emission cross section of 2.3 x 10(-20) cm(2). Our measurement technique is expected to be most relevant for three-level and quasi-three-level laser media.