Probing Layer Number and Stacking Order of Few-Layer Graphene by Raman Spectroscopy
Probing Layer Number and Stacking Order of Few-Layer Graphene by Raman Spectroscopy
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DOI:
10.1002/smll.200901173
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发表时间:
2010-01-18
期刊:
影响因子:
13.3
通讯作者:
Thong, John T. L.
中科院分区:
文献类型:
--
作者:
Hao, Yufeng;Wang, Yingying;Thong, John T. L.
Graphene is a two-dimensional material defined as a planar honeycomb lattice of close-packed carbon atoms, where the electrons exhibit a linear dispersion near Dirac K points and behave as massless Dirac fermions.[1, 2] However, the valence and conduction bands in an AB stacked graphene bilayer split into two parabolic branches near the K point originating from the interaction of π electrons, and the electrons are hence described by massive Dirac fermions.[2–4] Moreover, a graphene bilayer is a tunable-gap semiconductor under electric-field biasing.[5] With a further increase in the number of layers along with AB stacking, the electronic structure reveals stepwise variations that eventually approach that of the three-dimensional counterpart.[6–8] Considering the close relation between the electronic properties and layer number of few-layer graphene (FLG), the ability to accurately determine the layer number and correlating this with the electronic structure is a prerequisite in understanding the evolution of the electronic properties from two-to threedimensional graphitic materials. In addition to graphene layers with AB stacking, FLG with arbitrary stacking (Figure 1) is considered to possess distinct properties arising from its different crystalline structure and π electron interactions.[9] Experimentally, it has been observed that the electro-and magnetotransport properties for folded graphene sheets are different to those ofABstacked bilayers.[10] Furthermore, FLG grown on SiC,[11] Ni,[12–14] and Ru [15] also have non-AB stacking order. Therefore, elucidating the detailed characteristics of this type of FLG is required not only for the overall understanding of the structural and electronic properties but also for the development of FLG-based devices. Raman scattering is a rapid, sensitive, and non-destructive tool for the characterization of carbon-based materials.[16] Furthermore, the phonons in Raman scattering are directly linked to the electronic dispersion of graphitic materials by the well-established double-resonance model, and thus the Raman signals manifest not only lattice vibrations but also the electronic band structure configuration and modifications.[17] During the past two to three years, several pioneering works have been carried out to elucidate the Raman characteristics of graphene, such as differentiating single-layer and bilayer from bulk graphite,[18–20] detecting charge impurities,[21, 22] structural defects,[18] edge states (armchair or zigzag),[29, 30] strain effects,[23] determining the crystalline orientations,[27, 28] and investigating electron–phonon coupling for biased graphene.[24–26]In this Communication, detailed work is carried out on Raman spectroscopy study of AB-stacked FLG: the full width at half-maximum (FWHM) of the 2D band is found to be a quantitative guide to distinguish the layer number (single-to five-layer) of FLG. The splitting of the electronic band structure in FLG is responsible for the stepwise broadening of 2D bands according to the theoretical model of double resonance. Subsequently, folded FLG is taken as an example to investigate the electronic properties of non-AB stacked FLG. The consistent blueshift and similarity in shape and FWHM of the 2D band of folded FLG suggest slightly modified electronic energy dispersion curves near the K points as well as weak coupling between graphene layers with arbitrary stacking. We emphasize the link between the Raman characteristics and the nature of the interlayer interaction, that is, AB stacking and non-AB stacking. This research provides a means for fast confirmation of layer number and stacking manner, and sheds insight into the evolution of the electronic band …