Defects of Base Metal Electrode Layers in Multi-Layer Ceramic Capacitor
Defects of Base Metal Electrode Layers in Multi-Layer Ceramic Capacitor
复制标题
多层陶瓷电容器中贱金属电极层的缺陷
DOI：
10.1111/j.1551-2916.2005.00431.x
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发表时间：
2005
影响因子：
3.9
通讯作者：
Wen
中科院分区：
文献类型：
--
作者：
Bang;Wen
超薄镍基金属作为多层陶瓷电容器的电极层决定了电容器的介电性能。用光学显微镜和扫描电子显微镜对两种陶瓷电容器(X7R和X5R)内电极层的翘曲和连续性以及BaTiO_3层与金属电极之间的二面角进行了表征。结果表明，芯片翘曲与内电极的不连续性密切相关。这种不连续主要是由于Ni层的瑞利不稳定性造成的，但由烧结产生的拉应力引起的不连续性较小。
An ultra-thin Ni-based metal used as the electrode layer in multilayer ceramic capacitor determines the dielectric performance of the capacitor. The warpage and the continuity of the inner electrode layers, and a dihedral angle between BaTiO3 layers and metal electrodes of two ceramic capacitors (X7R and X5R) were characterized by optical microscopy and scanning/transmission electron microscopes. The results show that the warpage of the chips is closely related to the discontinuity of the inner electrode. The discontinuity takes place mainly because of Rayleigh instability of the Ni layer, but is less induced by the tensile stress from sintering.