Numerical Analysis of Sampling Streak Camera for Higher Temporal Resolution Operation、IOP Conf
Numerical Analysis of Sampling Streak Camera for Higher Temporal Resolution Operation、IOP Conf
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用于更高时间分辨率操作的采样条纹相机的数值分析，IOP Conf
DOI：
10.1109/tmag.2011.2174343
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
H. Kawaguchi and Y. Ito
中科院分区：
文献类型：
--
作者：
川崎大輔;森宏美;土田孝;M.Ukai;鄭躍軍;石原一彦;H. Kawaguchi and Y. Ito
条纹相机是目前时间分辨率最高的发光现象测量设备之一，采样条纹相机是其先进的时域图像测量设备。一般情况下，采样条纹相机的时间分辨率小于传统的条纹相机，由于在设备中的复杂的电子运动。为了提高采样条纹相机的皮秒级的时间分辨率，在这个设备中的物理现象的理解是必不可少的，然后数值分析起着重要的作用。本文提出了一种基于粒子模拟方法（PIC）对静电场和相对论电子束运动进行自洽模拟的取样条纹相机的数值分析方法。数值模拟结果表明，由于空间电荷效应的影响，高时间分辨率的采样条纹相机将导致相位信息的严重不准确。
The streak camera is one of the highest temporal resolution measurement devices for luminous phenomena, and the sampling streak camera is its advanced device for image measurements in time domain. In general, the temporal resolution of the sampling streak camera is less than that of the conventional streak camera due to complicated electron motion in the device. For improvement of the sampling streak camera for higher temporal resolution of order of pico-second, understanding of physical phenomena in this device is essential and then numerical analysis play an important role. This paper presents a numerical analysis method of the sampling streak camera based on self-consistent simulation of electrostatic field and relativistic electron beam motion by using particle-in-cell (PIC) method. It is predicted from the numerical simulation that higher temporal resolution operation of the sampling streak camera will cause serious inaccuracy in phase information due to the space charge effects.