X-ray diagnostic line ratios for helium-like S XV applicable to tokamak plasmas
X-ray diagnostic line ratios for helium-like S XV applicable to tokamak plasmas
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适用于托卡马克等离子体的类氦 S XV 的 X 射线诊断线比
DOI：
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发表时间：
1991
期刊：
影响因子：
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通讯作者：
F. Keenan
中科院分区：
文献类型：
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作者：
F. Keenan
利用最近的He-like S XV的电子冲击激发率计算，推导出理论电子温度和密度敏感发射谱线比G（= (f + i)/r）和r (= f/i)，其中f、i和r分别是禁止的1s2 1S-1s2s 3S、互合1s2 1S-1s2p 3P1、2和共振1s2 1S-1s2p 1P跃迁。我们发现R的结果与以前的计算有很大的不同，这主要是由于本文采用了改进的电子撞击激发率。我们估计目前的诊断应该准确到大约±15%。
Recent calculations of electron impact excitation rates for He-like S XV are used to derive the theoretical electron temperature and density sensitive emission line ratios G( = (f + i)/r) and R( = f/i), where f, i and r are the forbidden 1s2 1S-1s2s 3S, intercombination 1s2 1S-1s2p 3P1,2 and resonance 1s2 1S-1s2p 1P transitions, respectively. Our results for R are found to be significantly different from previous calculations, due primarily to the adoption of improved electron impact excitation rates in the present paper. We estimate that the present diagnostics should be accurate to approximately ±15%.