Investigation of deep defects and their effects on the properties of NiO/β-Ga2O3 heterojuncion diodes
Investigation of deep defects and their effects on the properties of NiO/β-Ga2O3 heterojuncion diodes
复制标题
深缺陷及其对 NiO/β-Ga2O3 异质结二极管性能影响的研究
DOI：
10.1016/j.mtelec.2023.100042
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发表时间：
2023
期刊：
影响因子：
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通讯作者：
Galeti, Helder Vinicius
中科院分区：
文献类型：
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作者：
Almalki, Abdulaziz;Madani, Labed;Sengouga, Nouredine;Alhassan, Sultan;Alotaibi, Saud;Alhassni, Amra;Almunyif, Amjad;Chauhan, Jasbinder S.;Henini, Mohamed;Galeti, Helder Vinicius
