TXRF intensity dependence on position of dried residue on sample carrier and TXRF determination of halogen in liquid samples
TXRF intensity dependence on position of dried residue on sample carrier and TXRF determination of halogen in liquid samples
复制标题
TXRF 强度对样品载体上干燥残留物位置的依赖性以及液体样品中卤素的 TXRF 测定
DOI:
10.1002/xrs.2688
复制
发表时间:
2016
影响因子:
1.2
通讯作者:
K. Tsuji
中科院分区:
文献类型:
--
作者:
Y. Tabuchi;K. Tsuji
Total reflection X‐ray fluorescence (TXRF) spectroscopy is an effective technique for simultaneous multi‐elemental trace analysis of a small volume of a sample placed on a flat substrate. An internal standard method is usually applied for quantitative TXRF analysis of liquid samples such as drinking water and environmental samples. However, it was difficult to determine Cl and Br because they were lost as volatile hydrogen halide compounds by adding an acid internal standard solution. Thus, we attempted to apply the traditional calibration curve method for the determination of halogens without internal standard. If internal standard method is not applied, the TXRF intensity drastically changes depending on the relative position of the dried residue to the detector. Therefore, we investigated the relationship between TXRF intensity and the position of dried residue relative to the detector. As a result, it was confirmed that TXRF intensity critically depended on the position of the dried residue on the sample carrier. The position of the droplet of the sample solution was carefully controlled by using an air blower in order to place the dried residue at the most effective position on the sample carrier. We could successfully make a calibration curve for Cl with a good relationship without internal standard. Finally, Cl in the NaCl solutions (0 –5 ppm, 10 µl) was successfully determined by the calibration curve method using a table‐top TXRF instrument. The limit of detection of Cl was 63 ppb (ng/ml). Copyright © 2016 John Wiley & Sons, Ltd.