X-ray free-electron laser based dark-field X-ray microscopy: a simulation-based study
X-ray free-electron laser based dark-field X-ray microscopy: a simulation-based study
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DOI：
10.1107/s1600576721012760
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发表时间：
2022-02-01
影响因子：
6.1
通讯作者：
Poulsen, Henning Friis
中科院分区：
文献类型：
--
作者：
Holstad, Theodor Secanell;Raeder, Trygve Magnus;Poulsen, Henning Friis
暗场X射线显微镜（DFXM）是一种无损全场成像技术，提供了深埋晶体元件中微观结构和局部应变场的三维映射。这是通过在衍射光束中放置物镜透镜来实现的，从而给出放大的投影图像。到目前为止，该方法已应用于毫秒到小时的时间分辨率。在这项工作中，DFXM在皮秒时间尺度上使用的X射线自由电子激光源和泵浦探测方案的可行性被认为是。将热机械应变波模拟与几何光学和波前传播光学相结合，模拟金刚石单晶中声子动力学的DFXM图像。以直线加速器相干光源处的XCS仪器的规格为例，模拟DFXM图像清晰地显示了应变波的传播。
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three-dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, the feasibility of DFXM at the picosecond time scale using an X-ray free-electron laser source and a pump-probe scheme is considered. Thermomechanical strain-wave simulations are combined with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source as an example results in simulated DFXM images clearly showing the propagation of a strain wave.