Quantitative Analysis of Human Reliability on Pseudo-“Blindsight” Caused by ELF Electromagnetic Stimuli

Quantitative Analysis of Human Reliability on Pseudo-“Blindsight” Caused by ELF Electromagnetic Stimuli
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人类对极低频电磁刺激引起的伪“盲视”可靠性的定量分析

DOI:
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发表时间:
2015
期刊:
IEEE EMBC 2015 Late Breaking Abstracts
影响因子:
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通讯作者:
Shoogo Ueno
Shoogo Ueno
中科院分区:
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文献类型:
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作者:
Hidenori Nakagawa;Shoogo Ueno

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