Reciprocal space mapping and single-crystal scattering rods
Reciprocal space mapping and single-crystal scattering rods
复制标题
DOI：
10.1107/s0909049505030815
复制
发表时间：
2005-11-01
影响因子：
2.5
通讯作者：
Yanagi, H
中科院分区：
文献类型：
--
作者：
Smilgies, DM;Blasini, DR;Yanagi, H
使用线性气体检测器与匹配的索勒准直器相结合的倒易空间映射已被应用于绘制在固体表面上生长的定向良好的有机微晶的散射棒。提供公式来校正角度空间中的图像失真并确定所需的振荡范围，以便正确测量积分散射强度。
Reciprocal space mapping using a linear gas detector in combination with a matching Soller collimator has been applied to map scattering rods of well oriented organic microcrystals grown on a solid surface. Formulae are provided to correct image distortions in angular space and to determine the required oscillation range, in order to measure properly integrated scattering intensities.