Observation of the effects of tip magnetization states on magnetic force microscopy images

Observation of the effects of tip magnetization states on magnetic force microscopy images
复制标题

尖端磁化状态对磁力显微镜图像影响的观察

DOI:
--
复制
发表时间:
1999
期刊:
影响因子:
--
通讯作者:
S. Russek
S. Russek
中科院分区:
--
文献类型:
--
作者:
P. Rice;S. Russek

文献摘要

被引文献

相似文献

我们研究了磁头和磁头磁场之间的取向对随后的磁力显微镜图像的影响。我们观察到,常用的CoCr涂层尖端有一个剩余磁化分量与尖端轴平行。为了研究叶尖的钉住成分,在相对于叶尖轴的不同角度上施加了饱和场。每次尖端被磁化时,我们对一个硬盘样本进行成像,该样本具有光刻图案的地标,旨在使我们能够找到,成像和比较相同纳米大小的磁性特征的图像。我们还观察到,由于被成像样品的杂散磁场,尖端磁化的一个组成部分可以自由地动态旋转。为了研究这种影响,在成像时平行于尖端轴施加一个外部偏置场。该磁场有效地固定了针尖的磁化强度。有了这些技术,我们就可以比较针尖磁化对磁性的两种影响。
We have investigated the effect of the orientation between the tip and the tip-magnetizing field on the subsequent magnetic force microscopy images. We have observed that commonly used CoCr coated tips have a component of the remanent magnetization pinned parallel to the tip axis. In order to study the pinned component of the tip, saturating fields were applied at various angles relative to the tip axis. Each time the tip was magnetized, we imaged a hard disk sample that had lithographically patterned landmarks designed to allow us to find, image, and compare images of the same nanometer-sized magnetic feature. We have also observed a component of the tip magnetization that is free to rotate dynamically due to the stray magnetic fields of the sample being imaged. To study this effect, an external bias field was applied parallel to the tip axis while imaging. This field effectively pinned the tip magnetization. With these techniques, we are thus able to compare two effects of tip magnetization on magnetic ...