Structural characterization of thermally evaporated Bi2Te3 thin films
Structural characterization of thermally evaporated Bi2Te3 thin films
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DOI：
10.1016/j.jpcs.2006.09.014
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发表时间：
2007
影响因子：
4
通讯作者：
R. Sathyamoorthy;J. Dheepa
中科院分区：
文献类型：
--
作者：
R. Sathyamoorthy;J. Dheepa
采用热蒸发法在玻璃衬底上制备了Bi2Te3薄膜。X射线衍射研究证实，生长的薄膜是多晶的性质，具有六方结构。在所有厚度的薄膜中，薄膜都表现出沿[015]方向的沿着择优取向，同时还有丰富的[0111]和[110]晶面。各种结构参数，如晶格常数，晶粒尺寸，应变和位错密度已被计算，它们被发现是厚度依赖。晶胞参数为a= 4.38 μ m，c= 30.40 μ m。薄膜的晶粒尺寸随厚度的增加而增加，位错密度和微应变随厚度的增加而减小。测得Bi_2Te_3薄膜的平均键能为1.72eV，平均配位数为2.4。
Thermally evaporated Bi2Te3thin films were deposited on glass substrates. X-ray diffraction study confirmed that the growned films are polycrystalline in nature having hexagonal structure. The film exhibits preferential orientation along the [015] direction for the films of all thickness together with other abundant planes [0111] and [110]. Various structural parameters such as lattice constants, crystallite size, strain, and dislocation density have been calculated and they are found to be thickness dependent. The lattice parameters are found to be a=4.38Å and c=30.40Å. The grain size of the films increases with thickness as the dislocation density and the microstrain decreases with thickness. The mean bond energy and the average coordination number of Bi2Te3thin film are found to be 1.72eV and 2.4, respectively.