Microscopic residual stress evolution during deformation process of an Fe-Mn-Si-Cr shape memory alloy investigated using white X-ray microbeam diffraction
Microscopic residual stress evolution during deformation process of an Fe-Mn-Si-Cr shape memory alloy investigated using white X-ray microbeam diffraction
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DOI：
10.1016/j.msea.2013.01.064
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发表时间：
2013-05-15
期刊：
影响因子：
6.4
通讯作者：
Suzuki, S.
中科院分区：
文献类型：
--
作者：
Kwon, E. P.;Sato, S.;Suzuki, S.
利用白色X射线微束衍射技术研究了Fe-Mn-Si-Cr合金在形状记忆过程中不同奥氏体（γ）晶粒内微观残余应力的演变规律。使用高能白色X射线微束，小束径使我们能够测量具有特定取向的粗γ晶粒中的微观残余应力。拉伸变形后，由于应力诱发马氏体的形成，γ晶粒中产生了较大的残余压应力，但回复加热后，由于马氏体的逆相变，残余压应力几乎消失。取向接近和取向的晶粒中的压缩残余应力的大小< 144 >< 233 >高于取向接近的晶粒中< 001 >的压缩残余应力的大小。利用电子背散射衍射分析每个晶粒的显微结构表明，在压缩残余应力的大小的差异可以归因于不同的马氏体相变特性的晶粒。(C)2013爱思唯尔有限公司版权所有。
Microscopic residual stress evolution in different austenite (gamma) grains during shape memory process in an Fe-Mn-Si-Cr alloy was investigated using the white X-ray microbeam diffraction technique. The use of high-energy white X-ray microbeam with small beam size allowed us to measure the microscopic residual stress in coarse gamma grains with specific orientation. After tensile deformation large compressive residual stress was evolved in gamma grains due to the formation of stress-induced epsilon martensite, but upon recovery heating it almost disappeared as a result of reverse transformation of martensite. The magnitude of compressive residual stress was higher in grains with orientations close to < 144 > and < 233 > orientations than in a grain with near < 001 > orientation. Analysis of the microstructure of each grain using electron backscattering diffraction suggested that the difference in the magnitude of compressive residual stress could be attributed to different martensitic transformation characteristics in the grains. (C) 2013 Elsevier B.V. All rights reserved.