CARRIER DEEP-TRAPPING MOBILITY-LIFETIME PRODUCTS IN POLY(P-PHENYLENE VINYLENE)
CARRIER DEEP-TRAPPING MOBILITY-LIFETIME PRODUCTS IN POLY(P-PHENYLENE VINYLENE)
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DOI：
10.1063/1.112784
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发表时间：
1994-10-17
影响因子：
4
通讯作者：
HSIEH, BR
中科院分区：
文献类型：
--
作者：
ANTONIADIS, H;ABKOWITZ, MA;HSIEH, BR
为了估计深捕获迁移率寿命（mutau）产品的空穴和电子在聚（对亚苯基亚乙烯基）（PPV），无陷阱的空间电荷限制电流，和飞行时间的测量进行的双层装置包括PPV层和无陷阱的分子掺杂的聚合物层。 发现空穴和电子的Mutau产物分别约为10（-9）和10（-12）cm 2/V，对应于在10（5）V/cm的电场下空穴的平均范围为1 μ m，电子的平均范围为10埃。 电子的低Mutau值归因于PPV中电子的严重深度捕获，有效地减小了它们的范围。 电致发光器件的效率的影响进行了讨论。 (C)1994年美国物理学会。
In order to estimate the deep-trapping mobility-lifetime (mutau) product for holes and electrons in poly(p-phenylene vinylene) (PPV), trap-free space-charge-limited current, and time-of-flight measurements were performed on bilayer devices comprising of a PPV layer and a trap-free molecularly doped polymer layer. Mutau products of about 10(-9) and 10(-12) cm2/V were found for holes and electrons respectively, corresponding to an average range of 1 mum for holes and 10 angstrom for electrons under an electric field of 10(5) V/cm. The low mutau value for electrons is attributed to severe deep trapping of electrons in PPV, effectively reduces their range. Implications on the efficiency of electroluminescence devices are discussed. (C) 1994 American Institute of Physics.