Photon, Electron, and Secondary Ion Emission from Single C60 keV Impacts
Photon, Electron, and Secondary Ion Emission from Single C60 keV Impacts
复制标题
DOI：
10.1021/jz1014345
复制
发表时间：
2010-12-16
影响因子：
5.7
通讯作者：
Schweikert, E. A.
中科院分区：
文献类型：
--
作者：
Fernandez-Lima, F. A.;Eller, M. J.;Schweikert, E. A.
这封信提出了第一次观察到的光子，电子和二次离子的巧合发射从个人的C-60千电子伏的影响。光子，电子和二次离子产率的增加被观察到作为C-60射弹能量的函数。目标结构/组合物对纳米级光子和电子发射的影响示出为CsI目标。时间分辨光子发射的特征可以在于具有短衰减时间的UV-Vis范围内的快速分量发射，而电子和二次离子发射遵循泊松分布。
This Letter presents the first observation of coincidental emission of photons, electrons, and secondary ions from individual C-60 keV impacts. An increase in photon, electron, and secondary ion yields is observed as a function of C-60 projectile energy. The effect of target structure/composition on photon and electron emissions at the nanometer level is shown for a CsI target. The time-resolved photon emission may be characterized by a fast component emission in the UV-Vis range with a short decay time, while the electron and secondary ion emission follow a Poisson distribution.