Polychromatic diffraction contrast tomography

Polychromatic diffraction contrast tomography
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DOI:
10.1016/j.matchar.2014.07.026
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发表时间:
2014-11-01
影响因子:
4.7
通讯作者:
Ludwig, W.
Ludwig, W.
中科院分区:
材料科学1区
文献类型:
--
作者:
King, A.;Reischig, P.;Ludwig, W.

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本教程回顾介绍了使用多色辐射的三维纹理映射使用X射线衍射对比度断层扫描。其目的是产生一个3D地图的晶粒形状和取向内的散装,毫米大小的多晶样品。多色辐射的使用使得标准同步加速器X射线技术能够在更广泛的背景下应用:I)使用实验室X射线源允许衍射对比度断层摄影技术的更广泛的应用。2)中子源允许对大样品或含有高Z元素的样品进行研究。3)应用于同步辐射源,可以处理更小的样品,或者更快的测量可能是可能的。在数据采集和处理的挑战和特殊性,以及不同的变量的局限性,进行了讨论。(C)2014 Elsevier Inc. All rights reserved.
This tutorial review introduces the use of polychromatic radiation for 3D grain mapping using X-ray diffraction contrast tomography. The objective is to produce a 3D map of the grain shapes and orientations within a bulk, millimeter-sized polycrystalline sample. The use of polychromatic radiation enables the standard synchrotron X-ray technique to be applied in a wider range of contexts: I) Using laboratory X-ray sources allows a much wider application of the diffraction contrast tomography technique. 2) Neutron sources allow large samples, or samples containing high Z elements to be studied. 3) Applied to synchrotron sources, smaller samples may be treated, or faster measurements may be possible. Challenges and particularities in the data acquisition and processing, and the limitations of the different variants, are discussed. (C) 2014 Elsevier Inc. All rights reserved.