Application of the KolibriSensor® to combined atomic-resolution scanning tunneling microscopy and noncontact atomic-force microscopy imaging
Application of the KolibriSensor® to combined atomic-resolution scanning tunneling microscopy and noncontact atomic-force microscopy imaging
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DOI：
10.1116/1.3430544
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发表时间：
2010-05-01
影响因子：
1.4
通讯作者：
Rychen, Joerg
中科院分区：
文献类型：
--
作者：
Torbruegge, Stefan;Schaff, Oliver;Rychen, Joerg
将原子分辨扫描隧道显微镜(STM)和非接触原子力显微镜(NC-AFM)相结合，在室温超高真空中对压电式Kolibriy传感器进行了研究。该传感器具有很低的光谱偏转噪声密度，仅为6.5fM/根赫兹，这与其高的弹簧常数54万N/m相结合，有利于NC-AFM在亚纳米振荡幅度下稳定地工作。介绍了用STM和NC-AFM反馈方式记录的Si(111)(7x7)表面的原子分辨率成像。他们发现，与STM相比，NC-AFM在硅上进行原子分辨率成像时的尖端表面距离要小得多。结果表明，原子分辨率的NC-AFM和Si(111)(7×7)表面相同区域的动态STM图像能够区分空位和吸附。此外，还比较了动态STM和NC-AFM反馈模式下的石墨形貌。(C)2010年美国真空协会。[DOI：10.1116/1.3430544]
Combined atomic-resolution scanning tunneling microscopy (STM) and noncontact atomic-force microscopy (NC-AFM) studies are carried out with the piezoelectric KolibriSensor in ultrahigh vacuum at room temperature. The sensor exhibits a very low spectral deflection noise density of only 6.5 fm/root Hz which favors in combination with its high spring constant of 540 000 N/m stable NC-AFM operation at subnanometer oscillation amplitudes. The authors present atomic-resolution imaging on the Si(111)(7x7) surface recorded in STM and NC-AFM feedback mode. They find that the tip surface distance during atomic-resolution imaging on silicon is much smaller for NC-AFM compared to STM. It is shown that atomic-resolution NC-AFM and dynamic STM images of the same area on the Si(111)(7x7) surface enable a discrimination of vacancies and adsorbates. Furthermore, the topography of graphite imaged in dynamic STM and NC-AFM feedback mode is compared. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3430544]